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Determination of Common Analytes at Trace Levels in Zr Matrix by ICP-AES Without Chemical/Physical Separation

机译:无需化学/物理分离的ICP-AES测定Zr基质中痕量水平的常见分析物

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摘要

Chemical (ICP-AES) or physical (d.c. arc carrier distillation technique) separation of the major matrix, followed by the determination of trace metallic impurities in the raffinate, is a well accepted protocol in the nuclear industries to avoid spectral interferences from emission- rich matrices such as U, Pu, Zr, Th, etc. With ICP-AES analysis, the RSD is better (less than 5%), separation is time-consuming, involves handling of the materi- als which increases the chances of contamination, while the pre- cision of the d.c. arc technique is 15-25%. Thus, there is a need to have an ICP-AES-based methodology where the analytes can be determined in a nuclear matrix at trace levels without requiring chemical separation. In this paper, an attempt was made to develop a method for the determination of trace constituents in a Zr matrix without separation by using the flexibility of a charge coupled device(CCD) detector for choosing additional interference-free analytical lines for Mn, Fe, Ga, In, Sr, K, Li, Eu, Co, Zn, Ni, Cu, Al, and Si. It was observed that the analytes can be determined up to 0.1 μg/mL in the presence of Zr The results were also compared with routinely used methods and found to be satisfactory. In addi- ion, an analytical method was developed for the determination of zirconium by ICP-AES, including the identification of suitable analytical lines (343.823 nm, 257.139 nm, and 272.262 nm) and studying the analytical performance such as sensitivity, detection limits, etc.
机译:主要基质的化学(ICP-AES)或物理(dc电弧载流蒸馏技术)分离,然后确定萃余液中的痕量金属杂质,是核工业中一种可以避免由富发射光谱干扰的协议。使用ICP-AES分析时,RSD更好(小于5%),分离耗时,涉及处理材料,增加了污染的机会,而直流的精度电弧技术为15-25%。因此,需要一种基于ICP-AES的方法,其中无需化学分离即可在痕量水平的核基质中测定分析物。本文尝试通过使用电荷耦合器件(CCD)检测器的灵活性来选择Mn,Fe和Fe的其他无干扰分析线来开发一种无需分离即可确定Zr矩阵中痕量成分的方法。 Ga,In,Sr,K,Li,Eu,Co,Zn,Ni,Cu,Al和Si据观察,在Zr存在下,分析物的含量最高可以达到0.1μg/ mL。结果也与常规使用的方法进行了比较,结果令人满意。此外,还开发了一种通过ICP-AES测定锆的分析方法,包括鉴定合适的分析线(343.823 nm,257.139 nm和272.262 nm)以及研究分析性能,例如灵敏度,检测限,等等

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