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spin-on stacked films for low-k{sub}(eff) dielectrics

机译:spin-on stacked films for low-k{sub}(eff) dielectrics

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摘要

Spin-on dielectric technology is positioned for introduction into 3OOmm manufacturing. We have proposed a simple strategy that will allow the industry to implement low- k{sub}(eff) interconnect dielectric solutions, which will provide extendibility of existing tool sets for at least three technology generations. Manufacturers are currently evaluating the use of these spin-on organic and inorganic materials at the l3Onm technology node and below for production of devices by mid to late 2001. The ability to use these novel, stacked structures and to achieve a much lower k{sub}(eff) should provide a powerful and straightforward technology pathway to meet the ever-accelerating time lines of semiconductor manufacturers.

著录项

  • 来源
    《Solid State Technology》 |2001年第7期|105-106108110113-0|共5页
  • 作者

    Michael E. Thomas;

  • 作者单位

    ed.surg.med.tohoku.ac.jp;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 一般性问题;
  • 关键词

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