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首页> 外文期刊>Acta crystallographica. Section A, Foundations and advances. >X-ray molecular orbital analysis. II. Application to diformohydrazide, (NHCHO)(2)
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X-ray molecular orbital analysis. II. Application to diformohydrazide, (NHCHO)(2)

机译:x射线分析分子轨道。to diformohydrazide (NHCHO) (2)

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The molecular orbitals (MOs) of diformohydrazide have been determined from the electron density measured by X-ray diffraction. The experimental and refinement procedures are explained in detail and the validity of the obtained MOs is assessed from the crystallographic point of view. The X-ray structure factors were measured at 100 K by a four-circle diffractometer avoiding multiple diffraction, the effect of which on the structure factors is comparable to two-centre structure factors. There remained no significant peaks on the residual density map and the R factors reduced significantly. Among the 788 MO coefficients, 731 converged, of which 694 were statistically significant. The C-H and N-H bond distances are 1.032 (2) and 1.033 (3) angstrom, respectively. The electron densities of theoretical and experimental MOs and the differences between them are illustrated. The overall features of the electron density obtained by X-ray molecular orbital (XMO) analysis are in good agreement with the canonical orbitals calculated by the restricted Hartree Fock (RHF) method. The bonding-electron distribution around the middle of each bond is well represented and the relative phase relationships of the pi orbitals are reflected clearly in the electron densities on the plane perpendicular to the molecular plane. However, differences are noticeable around the O atom on the molecular plane. The orbital energies obtained by XMO analysis are about 0.3 a.u. higher than the corresponding canonical orbitals, except for MO10 to MO14 which are about 0.7 a.u. higher. These exceptions are attributed to the N-H center dot center dot center dot O'' intermolecular hydrogen bond, which is neglected in the MO models of the present study. The hydrogen bond is supported by significant electron densities at the saddle points between the H(N) and O'' atoms in MO7, 8, 14 and 17, and by that of O''-p extended over H(N) in MO21 and 22, while no peaks were found in MO10, 11, 13 and 15. The electron density of each MO clearly exhibits its role in the molecule. Consequently, the MOs obtained by XMO analysis give a fundamental quantum mechanical insight into the real properties of molecules.
机译:diformohydrazide的分子轨道(MOs)从电子密度就下定决心吗通过x射线衍射测量。详细解释和改进过程获得金属氧化物半导体的有效性评估从晶体的观点。x射线结构因素测量在100 K四个圆圈状的衍射仪避免多个衍射,对结构的影响因素与two-centre结构的因素。剩余密度地图和R的因素显著减少。系数,731聚合,其中有694人统计学意义。距离是1.032(2)和1.033(3)埃,分别。理论和实验金属氧化物半导体和它们之间的差异。电子密度的总体特征通过x射线分子轨道(XMO)分析良好的协议与规范化轨道计算的限制哈特里福克(RHF)方法。每个键代表,中间π的相对相位关系轨道是清楚地反映在电子在平面垂直于密度分子平面。明显在O原子在分子飞机。分析约0.3美高于相应的规范化轨道,MO10除外MO14高出约0.7美。例外是归因于- h点中心中心导中心导O”分子间氢债券,这是被忽视的帽的模型本研究。重要的电子密度在鞍点之间的H (N)和O”原子在MO7 814和17,O”- p的扩展在MO21和22 H (N),而没有发现山峰MO10 11 13和15。莫显然分子中展现它的作用。因此,获得的金属氧化物半导体XMO分析给出一个基本的量子力学的观点分子的真正属性。

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