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首页> 外文期刊>Acta crystallographica. Section A, Foundations and advances. >Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon
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Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon

机译:弯晶谱仪的分辨率x射线自由电子激光脉冲:钻石和硅

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摘要

The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters: (i) the ratio of the lattice spacing of the chosen reflection to the crystal thickness and (ii) a single parameter comprising crystal thickness, its bending radius, distance to a detector, and anisotropic elastic constants of the chosen crystal. The results allow the optimization of the parameters of bent-crystal spectrometers for the hard X-ray free-electron laser sources.
机译:光谱仪的分辨率函数基础上一个强烈的单晶弯曲(弯曲半径10厘米或更少)的评估。分辨率是由两个参数:控制(我)选择的晶格间距的比值反映晶体厚度和(2)单一参数组成晶体厚度,它的弯曲半径,距离探测器,各向异性弹性常数的选择晶体。的参数弯晶光谱仪硬x射线自由电子激光源。

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