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首页> 外文期刊>The Journal of Chemical Physics >Role of support in tuning the properties of single atom catalysts: Cu, Ag, Au, Ni, Pd, and Pt adsorption on SiO2/Ru, SiO2/Pt, and SiO2/Si ultrathin films
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Role of support in tuning the properties of single atom catalysts: Cu, Ag, Au, Ni, Pd, and Pt adsorption on SiO2/Ru, SiO2/Pt, and SiO2/Si ultrathin films

机译:支持调整单原子催化剂性能的作用:Cu,Ag,Au,Ni,Pd和Pt吸附在SiO 2 / Ru,SiO2 / Pt和SiO2 / Si超薄薄膜上

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The role of the support in tuning the properties of transition metal (TM) atoms is studied by means of density functional theory calculations. We have considered the adsorption of Cu, Ag, Au, Ni, Pd, and Pt atoms on crystalline silica bilayers, either free-standing or supported on Ru(0001) and Pt(111) metal surfaces. These systems have been compared with an hydroxylated SiO2/Si(100) film simulating the native oxide formed on a silicon wafer. The properties of the TM atoms change significantly on the various supports. While the unsupported silica bilayer weakly binds some of the TM atoms studied, the SiO2/Ru(0001) or SiO2/Pt(111) supports exhibit enhanced reactivity, sometimes resulting in a net electron transfer with the formation of charged species. Differences in the behavior of SiO2/Ru(0001) and SiO2/Pt(111) are rationalized in terms of different work functions and metal/oxide interfacial distances. No electron transfer is observed on the SiO2/Si(100) films. Here, the presence of hydroxyl groups on the surface provides relatively strong binding sites for the TM atoms that can be stabilized by the interaction with one or two OH groups. The final aspect that has been investigated is the porosity of the silica bilayer, at variance with the dense SiO2/Si(100) film. Depending on the atomic size, some TM atoms can penetrate spontaneously through the six-membered silica rings and become stabilized in the pores of the bilayer or at the SiO2/metal interface. This study shows how very different chemical properties can be obtained by depositing the same TM atom on different silica supports.
机译:通过密度泛函理论计算,研究了载体在调节过渡金属(TM)原子性质中的作用。我们考虑了铜、银、金、镍、钯和铂原子在晶体二氧化硅双层膜上的吸附,无论是独立的还是支撑在Ru(0001)和Pt(111)金属表面上。将这些系统与模拟在硅片上形成的天然氧化物的羟基化SiO2/Si(100)膜进行了比较。在不同的载体上,TM原子的性质发生了显著的变化。虽然未支撑的二氧化硅双层膜弱地结合了所研究的一些TM原子,但SiO2/Ru(0001)或SiO2/Pt(111)载体表现出增强的反应性,有时会导致带电物种形成的净电子转移。根据不同的功函数和金属/氧化物界面距离,对SiO2/Ru(0001)和SiO2/Pt(111)行为的差异进行了合理化。在SiO2/Si(100)薄膜上未观察到电子转移。在这里,表面上羟基的存在为TM原子提供了相对较强的结合位点,可通过与一个或两个OH基团的相互作用使其稳定。研究的最后一个方面是二氧化硅双层的孔隙率,与致密的SiO2/Si(100)膜不同。根据原子大小,一些TM原子可以自发穿透六元硅环,并在双层孔或SiO2/金属界面处变得稳定。这项研究表明,通过在不同的二氧化硅载体上沉积相同的TM原子,可以获得非常不同的化学性质。

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