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電磁ノイズ抑制体における電力損失の電磁界シミュレ一ション

机译:电磁噪声抑制器功率损耗的电磁场模拟

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摘要

Electromagnetic simulation of eddy currents and ferromagnetic resonance (FMR) losses in a thin film noise suppressor are discussed based on the 3D finite element method and 3D equivalent circuit network analysis models. Radio frequency (RF) noise power is dissipated into heat by these losses. The eddy currents have in-plane and out-of-plane loops, whose losses are a function of sheet resistance, i.e., the ratio of material resistivity to its thickness. The FMR frequency shifts from the original to higher frequencies in electronic devices because of demagnetization caused by local currents by wiring. This shift can be calculated with an electromagnetic field simulator based on Maxwell's equations, although the relative permeability and FMR frequency is defined by the Landau-Lifshitz-Gilbert (LLG) and Kittel's equations. These analyses were applied to an on-chip integrated noise suppressor, which exhibited a 10-dB improvement in long term evolution (LTE)-class cellular phone receiver circuit sensitivity.
机译:基于3D有限元方法和3D等效电路网络分析模型,讨论了薄膜噪声抑制器中的涡流和铁磁共振(FMR)损耗的电磁模拟。射频(RF)噪声功率通过这些损失消散成热量。涡流具有平面内和外平面环,其损耗是薄层电阻的函数,即其厚度的材料电阻率与其厚度的比率。由于由接线引起的局部电流引起的去磁,FMR频率从原始频率从原始频率移位到更高频率。这种转变可以通过基于Maxwell方程的电磁场模拟器计算,尽管相对渗透率和FMR频率由Landau-Lifshitz-Gilbert(LLG)和Kittel的方程定义。这些分析应用于片上集成噪声抑制器,其在长期演进(LTE) - 类蜂窝电话接收机电路灵敏度中表现出10dB的改进。

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