首页> 外文期刊>Journal of manufacturing science and engineering: Transactions of the ASME >Simultaneous Determination of Disassembly Sequence and Disassembly-to-Order Decisions Using Simulation Optimization
【24h】

Simultaneous Determination of Disassembly Sequence and Disassembly-to-Order Decisions Using Simulation Optimization

机译:使用模拟优化同时确定拆卸序列和拆卸的拆卸决策

获取原文
获取原文并翻译 | 示例
           

摘要

Strict environmental regulations and increasing public awareness toward environmental issues force many companies to establish dedicated facilities for product recovery. All product recovery options require some level of disassembly. That is why, the costeffective management of product recovery operations highly depends on the effective planning of disassembly operations. There are two crucial issues common to most disassembly systems. The first issue is disassembly sequencing which involves the determination of an optimal or near optimal disassembly sequence. The second issue is disassembly-to-order (DTO) problem which involves the determination of the number of end of life (EOL) products to process to fulfill the demand for specified numbers of components and materials. Although disassembly sequencing decisions directly affects the various costs associated with a disassembly-to-order problem, these two issues are treated separately in the literature. In this study, a genetic algorithm (GA) based simulation optimization approach was proposed for the simultaneous determination of disassembly sequence and disassembly-to-order decisions. The applicability of the proposed approach was illustrated by providing a numerical example and the best values of GA parameters were identified by carrying out a Taguchi experimental design.
机译:严格的环境法规,增加对环境问题的公众意识,强迫许多公司建立产品恢复的专用设施。所有产品恢复选项都需要某种级别的拆卸。这就是为什么产品恢复操作的成本效益管理高度取决于拆卸操作的有效规划。大多数拆卸系统都有两个常见的关键问题。第一个问题是拆卸测序,涉及确定最佳或近最佳拆卸序列。第二个问题是拆卸的订单(DTO)问题,涉及确定生命结束(EOL)产品的过程,以满足对指定数量的组件和材料的需求。虽然拆卸测序决策直接影响与拆卸有序问题相关的各种成本,但这两个问题在文献中单独处理。在该研究中,提出了一种基于遗传算法(GA)基于仿真优化方法,用于同时确定拆卸序列和拆卸秩序决策。通过提供数值示例来说明所提出的方法的适用性,并通过执行Taguchi实验设计来识别GA参数的最佳值。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号