Biplot evaluation of test environments and identification of lentil genotypes with durable resistance to fusarium wilt in India

摘要

Fusarium wilt (caused by Fusarium oxysporum f. sp. lentis) is the most crucial limiting variable for decreasing yield levels of lentils (Lens culinaris Medik.) around the world. A set of 20 diverse lentil genotypes comprising breeding lines and released varieties was evaluated, along with susceptible controls, for resistance to fusarium wilt through natural incidence for two continuous years (2010-11 and 2011-12) in six diverse lentil-growing environments in India. Analysis of variance showed that the effect of genotype (G) and environment (E) for disease incidence was highly significant. Among the three sources of variation, the biggest contribution in disease occurrence was accounted for by environment (54.68%), followed by GxE interaction (17.32%). The high GxE variation necessitated assessment of the genotypes at different locations (environments). GGE biplot analysis of the studied genotypes revealed that genotype PL 101 and released cultivar L 4076 had low levels of disease incidence. The sources of resistance to fusarium wilt have great potential for use in lentil-breeding programs. Another biplot of relationships among environments demonstrated that, among the test locations, Sehore and Faizabad, were the most effective for differentiation of genotypes. On the basis of discriminating ability and representativeness, the Sehore location appeared an ideal testing site for natural incidence of F. oxysporum f. sp. lentis.