Nonvolatile bipolar resistive switching in an Ag/TiO _2/Nb: SrTiO _3/In device

摘要

A TiO _2 thin film was deposited on a Nb:SrTiO _3 substrate by pulsed laser deposition to form an Ag/TiO _2/Nb:SrTiO _3/In device. The bipolar resistive switching (RS) effect of this device was investigated. The currentvoltage characteristics exhibited pronounced and stable bipolar RS features. The device could be switched to a low resistance state (LRS) at forward voltage and returned to a high resistance state (HRS) at reverse voltage, and the RS ratio R _(HRS)/R _(LRS) reached up to 2×10 ~3 at a read voltage of -0.5V. Moreover, the RS ratio could be adjusted by changing the maximum value of the forward or reverse voltage, which shows promise for multilevel memories. These results are discussed by considering carrier injection-trapped/detrapped process of the heterostructure and show high potential for nonvolatile memory applications.