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首页> 外文期刊>Physica, C. Superconductivity and its applications >Analytic expressions for critical-state ac susceptibility of rectangular superconducting films in perpendicular magnetic field
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Analytic expressions for critical-state ac susceptibility of rectangular superconducting films in perpendicular magnetic field

机译:矩形超导薄膜在垂直磁场中的临界态磁化率的解析表达式

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摘要

A set of analytic expressions for the critical-state magnetization and ac susceptibility chi'-j chi '' curves of rectangular superconducting films of arbitrary aspect ratio in perpendicular field is obtained. They are formulated based on the exact/accurate high/low-field limits for rectangular films together with the exact analytic formulas for thin circular disks. Thus, the accuracy of the expressions is very high in high and low fields. At a characteristic intermediate field amplitude, where chi '' takes its maximum, the error is checked by direct numerical calculations to be well below 1%. Thus, the provided expressions can be conveniently and satisfactorily used for practical and theoretical researches of superconducting materials, such as coated conductors.
机译:得到了一组在垂直场中任意纵横比的矩形超导薄膜的临界态磁化强度和磁化率chi'-j chi''曲线的解析表达式。它们是根据矩形薄膜的准确/准确的高/低场限制以及薄圆盘的精确解析公式制定的。因此,在高场和低场中,表达式的准确性非常高。在特征中间场振幅(其中chi''取最大值)处,通过直接数值计算将误差检查为远远低于1%。因此,所提供的表述可以方便地和令人满意地用于超导电材料,例如涂覆导体的实践和理论研究。

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