A Double Crystal Rocking Curve setup has been developed in the non dispersive (+ -) configuration for the analysis of crystalline perfection in bulk single crystals and epitaxial layers. The X-rays from a conventional laboratory source have been monochro-collimated by diffracting them from a perfect Si (111) crystal. The system has been automatized using a stepper motor for the goniometric rotation and an ADC card for reading the detector output. A driver/control and data collection software has been written to interface the system with the computer.
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