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Mechanism of Friction Reduction and Nanoscale Controlling Factors in MoDTC/ZDDP Tribofilms

机译:MoDTC / ZDDP摩擦膜的减摩机理和纳米级控制因素

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摘要

Tribology is the technology or field of study concerning interactions between surfaces of two materials performing repetitive relative motions. The coating of the region of sliding by different materials, a modification of the chemical state of the surfaces and a change of lubrication conditions allow the provision and the control of specific physical properties of the sliding surfaces on the nanometer scale. Therefore, the discovery of new tribological properties and a significant improvement of the functions can be expected. That is why a close attention has been focused on studies related to functions, properties and nanostructure of the sliding surfaces considered as factors of the control of microscopic triboproperties and the studies have been quickly performed. The clarification of the correlations and such factors of control strongly require the direct acquirement of information about different physical properties and characteristics on the nanometer scale. However, traditional analytical and problem solving methods are mainly based on the application of beams (light: optical microscopy and infrared spectroscopy; X-ray: X-ray photon-electron spectroscopy (XPS) and X-ray diffraction; electron beam: electron microscopy, Auger electron spectroscopy (AES), and electron probe microanalyzer and the like). All these methods focus on information on morphology, composition, structure, and conditions. Therefore, it is rather difficult to acquire information on physical properties by direct measurements using the above analytical methods. Accumulating indirect experimental information and knowledge and experience only allow generally estimating phenomena.
机译:摩擦学是一种技术或研究领域,涉及两种材料重复执行相对运动的表面之间的相互作用。通过不同材料的滑动区域的涂层,表面化学状态的改变以及润滑条件的改变允许在纳米级上提供和控制滑动表面的特定物理性质。因此,可以期待发现新的摩擦学性质和功能的显着改善。因此,一直密切关注与滑动表面的功能,特性和纳米结构有关的研究,这些研究被认为是控制微观摩擦性能的因素,并且研究已经迅速进行。为了弄清相关性和控制因素,强烈需要直接获取有关纳米级不同物理性质和特性的信息。但是,传统的分析和解决问题的方法主要基于光束的应用(光:光学显微镜和红外光谱; X射线:X射线光子电子光谱(XPS)和X射线衍射;电子束:电子显微镜,俄歇电子能谱(AES)和电子探针显微分析仪等)。所有这些方法都集中在有关形态,组成,结构和条件的信息上。因此,使用上述分析方法通过直接测量来获取有关物理性质的信息相当困难。累积间接实验信息以及知识和经验只能大致估计现象。

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