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Structural and optical properties of AgInSe_2 films

机译:AgInSe_2薄膜的结构和光学性质

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Silver Indium selenide (AgInSe_2) films have been prepared by thermal evaporation technique onto the glass substrate kept in the range (473-573 K) at pressure of 1.3x10~(-5)Torr. The films so prepared were studied for structural, electrical and optical properties. The films appear to be n-type indicating electrons as dominant charge carriers and show increase in electrical conductivity with corresponding increase in substrate temperature .X-ray diffraction pattern reflects AgInSe_2 single phase with predominant (112) orientation. Scanning electron micrographs show an increase in grain size with substrate temperature which may be attributed to more ordered structure. The films show an allowed transition near the fundamental absorption edge (Eg_1) in addition to a transition originating from crystal field split levels (Eg_2). The optical band gap of the films lie in the range 1.19-1.98 eV.
机译:通过热蒸发技术在1.3×10〜(-5)Torr的压力下将硒化银铟(AgInSe_2)薄膜制备在玻璃衬底上(473-573 K)。研究了如此制备的膜的结构,电和光学性能。薄膜看起来是n型,表明电子是主要的电荷载流子,并且随着基底温度的相应升高而显示出电导率的增加。X射线衍射图反映了AgInSe_2单相的主要(112)取向。扫描电子显微照片显示晶粒尺寸随基材温度的增加而增加,这可能归因于结构更加有序。薄膜显示了除源自晶场分裂能级(Eg_2)的跃迁外,还允许在基本吸收边缘(Eg_1)附近发生跃迁。薄膜的光学带隙在1.19-1.98 eV的范围内。

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