Recent advancements in Whole Powder Pattern Modelling

摘要

Advantages of Whole Powder Pattern Modelling against conventional Line Profile Analysis methods are briefly reviewed, and a specific example is discussed on the possible ambiguity in the interpretation of the Williamson-Hall plot for polydisperse systems. Ad-vancements in WPPM concerning dislocation line broadening are illustrated with examples taken from the recent literature. Reliability and limits in the application of WPPM to nanocrystalline systems are also discussed.