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首页> 外文期刊>IEEE transactions on very large scale integration (VLSI) systems >A Reliability-Oriented Startup Analysis of Injection-Locked Frequency Divider Based on Broken Symmetry Theory
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A Reliability-Oriented Startup Analysis of Injection-Locked Frequency Divider Based on Broken Symmetry Theory

机译:基于破碎对称理论的注入锁定分频器的可靠性启动分析

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摘要

In this brief, an analytical model for the reliability-oriented design of injection-locked frequency divider (ILFD) is proposed. It is able to provide a clear evaluation of startup condition in the ring oscillator (RO)-based ILFD, which has not been clearly defined with the conventional zero-pole theory. A new startup condition analysis is presented and applied in designing an ILFD to achieve a reasonable compromise between a robust startup condition and a wide locking range. To verify this theory, a prototype is fabricated using a standard 0.18-mu m CMOS process, maintaining a reliable startup over potential variations of manufacturing or working conditions. The experimental results at industrial temperature ranges under different supply voltages suggest that the proposed divider is able to work robustly from 0.19 to 1.24 GHz with a maximum power consumption of 0.246 mW from a 1.2-V supply, while occupying a silicon area less than 20 x 30 mu m(2).
机译:在此简介中,提出了一种用于注入锁定分频器(ILFD)的面向可靠性设计的分析模型。它能够对基于环形振荡器(RO)的ILFD中的启动条件提供清晰的评估,而传统的零极点理论尚未明确定义启动条件。提出了一种新的启动条件分析,并将其应用于设计ILFD,以在稳健的启动条件和宽锁定范围之间达成合理的折衷。为了验证这一理论,使用标准的0.18微米CMOS工艺制造了原型,并在制造或工作条件可能发生变化的情况下保持了可靠的启动。在不同电源电压下工业温度范围内的实验结果表明,所建议的分频器能够在0.19至1.24 GHz的频率范围内稳定工作,而1.2V电源的最大功耗为0.246 mW,而硅面积却不到20 x 30微米(2)。

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