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首页> 外文期刊>Thin Solid Films >One order enhancement of detectivity in quaternary capped InAs/GaAs quantum dot infrared photodetectors due to vertical coupling of quantum dot layers
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One order enhancement of detectivity in quaternary capped InAs/GaAs quantum dot infrared photodetectors due to vertical coupling of quantum dot layers

机译:由于量子点层的垂直耦合,四级封盖的InAs / GaAs量子点红外光电探测器的探测能力提高了一个阶次

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摘要

The spectral and electrical properties of vertically coupled quaternary (InAlGaAs) capped InAs/GaAs quantum dot infrared photodetector with different capping thicknesses are investigated, and compared with a conventional quaternary capped uncoupled detector. Electronic coupling between quantum dot layers leads to a reduction in the ground state energy level and hence greater electronic confinement, which reduces the dark current and enhances the detectivity. These expectations are confirmed by our experimental results. Most significantly one order enhancement in peak detectivity (from 1.1 × 10~9 cm Hz~(1/2)/W to 2.48 × 10~(10) cm Hz~(1/2)/W) is observed for optimized coupled quantum dot infrared photodetector compared to uncoupled device. The optimal interlayer barrier thickness which gives maximum detectivity is explained in terms of the interplay between electronic coupling and strain buildup in the heterostructure.
机译:研究了具有不同封盖厚度的垂直耦合四元(InAlGaAs)封盖的InAs / GaAs量子点红外光电探测器的光谱和电学性质,并将其与常规四元封盖的非耦合检测器进行了比较。量子点层之间的电子耦合导致基态能级的降低,并因此导致更大的电子限制,从而减少了暗电流并提高了检测能力。我们的实验结果证实了这些期望。对于优化的耦合量子,观察到的峰值检出率最明显的一阶增强(从1.1×10〜9 cm Hz〜(1/2)/ W到2.48×10〜(10)cm Hz〜(1/2)/ W)点红外光电探测器与非耦合设备相比。通过异质结构中电子耦合和应变积累之间的相互作用来解释提供最大检测能力的最佳层间势垒厚度。

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