...
首页> 外文期刊>Thin Solid Films >Thermoelectric and photoconductivity properties of zinc oxide-tin oxide binary systems prepared by spray pyrolysis
【24h】

Thermoelectric and photoconductivity properties of zinc oxide-tin oxide binary systems prepared by spray pyrolysis

机译:喷雾热解法制备氧化锌-氧化锡二元体系的热电和光电导性质

获取原文
获取原文并翻译 | 示例
           

摘要

Zinc oxide-Tin oxide (ZnO-SnO) binary thin films were prepared on the glass substrates by spray pyrolysis method. The variation range of the molar ratio of x = [Sn]/[Zn] considered to be changed from 5% to 50%. The films characterized by using the X-ray diffraction (XRD) technique, UV-Vis-NIR spectroscopy, Hall effect, Seebeck effect, electrical and photoconductivity measurements. Using the scanning electron microscopy (SEM) and atomic force microscopy (AFM) images the morphology and roughness of the thin films surfaces were obtained, respectively. AFM micrographs indicate the decrease of roughness by increasing the dopant (Sn) concentration (x). XRD results describe the existence of the ZnO, SnO, SnO_2, ZnSnO_3 and Zn_2SnO_4 phases for various x values. The optical band gap and transmittance were obtained from UV-Vis-NIR spectroscopy results as a function of x. The results show a general band gap narrowing which occurs with the increasing of the Sn concentration which attributed to the structure and many body effects. Moreover, comparing to ZnO thin films, the remarkable decrease of the electrical conductivity and optical transparency were observed at the low x values. The conduction type was determined by the Hall effect and thermoelectric measurements. The Seebeck effect measurements show for ΔT ≤ 185 K, the electrons are the majority carriers, which replaced with the holes for ΔT > 185 K. Power factor quantity was measured as a function of the Sn concentration and temperature. Furthermore, the power factor determines the best x value for the optimal electrical properties. Photoconductivity property was also observed in all samples which weakened for x ≤30%, and increased for the higher x values.
机译:采用喷雾热解法在玻璃基板上制备了氧化锌-氧化锡(ZnO-SnO)二元薄膜。 x = [Sn] / [Zn]的摩尔比的变化范围被认为从5%改变为50%。该膜的特征在于使用X射线衍射(XRD)技术,UV-Vis-NIR光谱,霍尔效应,塞贝克效应,电导率和光电导率测量。使用扫描电子显微镜(SEM)和原子力显微镜(AFM)图像分别获得了薄膜表面的形貌和粗糙度。 AFM显微照片表明,通过增加掺杂剂(Sn)浓度(x)可以降低粗糙度。 XRD结果描述了各种x值下ZnO,SnO,SnO_2,ZnSnO_3和Zn_2SnO_4相的存在。从UV-Vis-NIR光谱学结果获得光学带隙和透射率,其为x的函数。结果表明,随着Sn浓度的增加,普遍的带隙变窄,这归因于结构和许多人体效应。此外,与ZnO薄膜相比,在低x值下观察到电导率和光学透明性显着降低。传导类型由霍尔效应和热电测量确定。塞贝克效应的测量结果表明,对于ΔT≤185 K,电子是多数载流子,对于ΔT> 185 K,电子被空穴取代了。功率因数的测量是Sn浓度和温度的函数。此外,功率因数决定了最佳电性能的最佳x值。在所有样品中都观察到了光电导性能,对于x≤30%则减弱,对于更高的x值则提高。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号