Single-Flange 2-Port TRL Calibration for Accurate THz src='/images/tex/702.gif' alt='{rm S}'> -Parameter Measurements of Waveguide Integrated Circuits

摘要

This paper describes a single flange 2-port measurement setup for ${rm S}$-parameter characterization of waveguide integrated devices. The setup greatly reduces calibration and measurement uncertainty by eliminating vector network analyzer (VNA) extender cable movement and minimizing the effect of waveguide manufacturing tolerances. Change time of standards is also improved, reducing the influence of VNA drift on the uncertainty. A TRL calibration kit has been manufactured and measurements are demonstrated in WR-03 (220–325 GHz).