X-ray characterization of as-deposited, epitaxial films of Bi(012) on Au(111)

摘要

Electrodeposition is used to produce epitaxial single-crystal films on Au(111) substrates without annealing or other post-deposition modification. X-ray techniques show that the Bi(012) plane is parallel to the underlying Au(111) surface, and the azimuthal orientation of the films is determined. Combination of the X-ray data with in situ scanning tunneling microscopy (STM) images suggests a common growth mode from the first few layers up to thick films.