Photoemission electron microscopy study of anthracene growth on Si(111)

摘要

The thin film growth of anthracene films on Si(111) surfaces is studied by photoemission electron microscopy (PEEM). The thin film growth of anthracene on Si(111) is similar to the growth of pentacene on silicon. Initially a layer of flat lying molecules chemisorbs on the surface. Subsequent growth of fractal islands with standing up molecules proceeds on top of this flat layer.