首页> 外文期刊>Superlattices and microstructures >Effect of Stone-Wales defect on an armchair graphene nanoribbon-based photodetector
【24h】

Effect of Stone-Wales defect on an armchair graphene nanoribbon-based photodetector

机译:Stone-Wales缺陷对扶手椅石墨烯纳米带基光电探测器的影响

获取原文
获取原文并翻译 | 示例
           

摘要

The effect of Stone-Wales (SW) defect on the performance of an armchair graphene nanoribbon (AGNR)-based photodetector is studied. To model the SW defect two new tight-binding (TB) parameters are proposed that provide results that are in good agreement with density functional theory calculations. SW defect is introduced in different locations in the channel of the AGNR detector and the photocurrent, quantum efficiency and responsivity of defected structures are calculated using TB approximation and non-equilibrium Green's function formalism. By inspecting the photo-generated hole density in different points of the channel, the way that photocurrent is affected by SW defect in different defected structures is investigated. Our results show that the photocurrent of AGNR photodetector varies with the number and position of SW defect in the channel. Among the defected structures highest quantum efficiency is observed in the structure in which the SW defect is located near the contact with a higher bias voltage. However, the quantum efficiency in all defected structures is lower than their perfect counterpart. Since the low ratio of the photocurrent to the dark current limits the performance of photodetectors, improving this ratio is of great importance. We show that the presence of SW defect in the channel of AGNR photodetector increases this ratio. It is observed that the ratio of photocurrent to the dark current in the double-defect structure in which two SW defects are located at two ends of the channel is 4.7 times larger than the perfect photodetector. Our results also show that by inserting SW defect in the channel of AGNR photodetector its photo-detection range can be tuned to higher energies.
机译:研究了Stone-Wales(SW)缺陷对基于扶手椅石墨烯纳米带(AGNR)的光电探测器性能的影响。为了模拟SW缺陷,提出了两个新的紧密结合(TB)参数,这些参数提供的结果与密度泛函理论计算非常吻合。将SW缺陷引入AGNR检测器的通道中的不同位置,并使用TB近似和非平衡格林函数形式来计算缺陷结构的光电流,量子效率和响应度。通过检查通道不同点的光生空穴密度,研究了在不同缺陷结构中光电流受SW缺陷影响的方式。我们的结果表明,AGNR光电探测器的光电流随通道中SW缺陷的数量和位置而变化。在这些缺陷结构中,在SW缺陷位于具有较高偏置电压的触点附近的结构中,观察到了最高的量子效率。但是,所有缺陷结构中的量子效率都低于其完美对应物。由于光电流与暗电流的比率低限制了光电检测器的性能,因此提高该比率非常重要。我们表明,AGNR光探测器通道中SW缺陷的存在增加了该比率。可以看出,在两个缺陷位于沟道两端的双缺陷结构中,光电流与暗电流之比是理想光电探测器的4.7倍。我们的结果还表明,通过在AGNR光电探测器的通道中插入SW缺陷,可以将其光电探测范围调整到更高的能量。

著录项

  • 来源
    《Superlattices and microstructures》 |2019年第6期|127-138|共12页
  • 作者

  • 作者单位

    Department of Electrical Engineering Science and Research Branch Islamic Azad University Tehran Iran;

    Electrical Engineering Department Sharif University of Technology Tehran Iran;

    Faculty of Electrical and Computer Engineering Advanced Devices Simulation Lab Tarbiat Modares University P. O. Box 14115-194 Tehran 1411713116 Iran;

    Electrical Engineering Department Shahed University Tehran Iran;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号