Avoid throwing darts at a black hole by using diagnosis-driven yield analysis

摘要

An increase in subtle systematic defect mechanisms, smaller feature sizes, and more complex designs make it significantly more time consuming to identify the cause of yield loss using traditional methods. The challenge on the design side is to aim the efforts at the right yield issues. To hit a bull's eye rather than a black hole with our yield improvement efforts, we can leverage the wealth of information that hides in the manufacturing test results using a technique called diagnosis-driven yield analysis - a technique described in this article.