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Effect of contact geometry on 4H-SiC rectifiers with junction termination extension

机译:接触几何形状对带有结终端扩展的4H-SiC整流器的影响

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SiC rectifiers with an on/off current ratio of 4 x 10~5 (at 1.5 V/-500 V) were fabricated using junction termination extension (JTE) and dielectric overlap. The reverse breakdown voltage was inversely dependent on contact area and was not a strong function of JTE length up to 40 μm. Similarly, for a given JTE length, the metal overlap did not have a strong influence on breakdown voltage. Oval- and circular-shaped contacts produced larger breakdown voltages than square rectifying contacts. The on-state resistance, R_(ON), was 4.2 mΩcm~2, which is close to the theoretical minimum of these rectifiers using Ni Schottky contacts. The figure-of-merit (V_B)~2 /R_(ON) was as high as 156 MW cm~(-2).
机译:使用结终端扩展(JTE)和电介质重叠技术制造了具有4 x 10〜5(在1.5 V / -500 V时)开/关电流比的SiC整流器。反向击穿电压与接触面积成反比,并不是JTE长度高达40μm的强函数。类似地,对于给定的JTE长度,金属重叠对击穿电压没有很大影响。椭圆形和圆形触点比方形整流触点产生更大的击穿电压。通态电阻R_(ON)为4.2mΩcm〜2,接近于使用Ni肖特基触点的这些整流器的理论最小值。品质因数(V_B)〜2 / R_(ON)高达156 MW cm〜(-2)。

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