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Composite ULP diode fabrication, modelling and applications in multi-V_(th) FD SOI CMOS technology

机译:复合ULP二极管的制造,建模和在多V_(th)FD SOI CMOS技术中的应用

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We present new SOI basic circuit cells architectures for ultra-low power (ULP) applications that use transistors in very weak inversion. These cells take advantage of the possibility to obtain multi-threshold transistors in fully depleted (FD) SOI CMOS with no additional cost. In particular, a new composite ULP diode is proposed and modelled. It has been fabricated on 0.18 and 2 |im FD SOI technologies and demonstrated a reduction of leakage currents by four orders of magnitude compared to standard MOS diode implementation. We demonstrate that the ULP diode can be used to realize memory cells that present strongly reduced static power consumption compared to standard SRAM cells and can work under 0.5 V supply voltage. As particular application, simulations of ULP memory latches used as level-keepers in MTCMOS circuits to maintain information on floating nodes during standby mode demonstrate static power savings of 20% when compared to the best traditional schemes with comparable speed performance. Finally, measurements show that the new proposed ULP cells keep functionality at high temperature.
机译:我们针对超低功耗(ULP)应用提出了新的SOI基本电路单元架构,该架构在非常弱的反型下使用晶体管。这些单元利用了无需额外成本即可在完全耗尽(FD)SOI CMOS中获得多阈值晶体管的可能性。特别是,提出并建模了一种新型复合ULP二极管。它采用0.18和2im FD SOI技术制造,与标准MOS二极管实现相比,其泄漏电流降低了四个数量级。我们证明了与标准SRAM单元相比,ULP二极管可用于实现显着降低的静态功耗并且可在0.5 V电源电压下工作的存储单元。作为特定的应用,与待机性能最佳的传统方案相比,在待机模式下在MTCMOS电路中用作电平保持器以在浮动节点上保持信息的ULP存储器锁存的仿真表明,静态功耗可节省20%。最后,测量结果表明,新提议的ULP电池可在高温下保持功能。

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