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机译:硅纳米线静电驱动单轴拉伸试验装置的设计与开发
Department of Mechanical Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan,JSPS Research Fellow, Japan Society for the Promotion of Science, 5-3-1 Kojimachi, Chiyoda-ku, Tokyo 102-0083, Japan;
The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan;
Department of Mechanical Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan;
Department of Mechanical Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2201, Japan;
silicon nanowire; tensile test; electrostatic actuator; capacitive sensor; mechanical property; MEMS;
机译:具有纳米牛顿和纳米分辨率的静电拉伸测试装置及其在$ hbox {C} _ {60} $纳米线测试中的应用
机译:硅纳米线的静电驱动拉伸阶段原位电子显微镜力学测试
机译:使用静电驱动的纳米拉伸测试装置的FIB沉积碳纳米线的机械特性
机译:使用MEMS静电检测装置的集成单晶硅纳米线的拉伸骨折
机译:新型基于硅的可控整流器(SCR)的器件的设计,表征和紧凑模型,用于集成电路中的静电放电(ESD)保护应用。
机译:采用定制组织切割机夹具和模具的单轴拉伸试验样品几何形状和大小对猪主动脉性能的影响
机译:硅纳米线静电单轴拉伸试验装置的设计与开发