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Optoelectrical properties of electrodeposited Cd_xHg_(1-x)Te with a bandgap energy of 1.35 eV

机译:带隙能为1.35 eV的电沉积Cd_xHg_(1-x)Te的光电性能

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摘要

Cadmium mercury telluride with a bandgap energy of 1.35 eV has been electrodeposited on a stainless-steel substrate. We briefly discuss the deposition and structure of the film. Gold Schottky diodes have been fabricated for the characterization of the material using various optoelectrical techniques. Among these are the bias dependence of the junction photocurrent and capacitance (in the dark and under illumination), the temperature dependence of the built-in potential and the bandgap energy, and the photo-induced current transient spectroscopy. In this paper, we reveal that the material has a resistivity in the range of 10~5 Ω cm and a donor concentration of 1 × 10~(15) cm~(-3).
机译:带隙能量为1.35 eV的碲化镉汞已被电沉积在不锈钢基底上。我们简要讨论了膜的沉积和结构。已经使用各种光电技术制造了金肖特基二极管来表征材料。其中包括结光电流和电容(在黑暗和光照条件下)的偏置相关性,内置电势和带隙能量的温度相关性以及光感生电流瞬态光谱。在本文中,我们发现该材料的电阻率在10〜5Ωcm范围内,施主浓度为1×10〜(15)cm〜(-3)。

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