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首页> 外文期刊>Semiconductor science and technology >Influence of the surface charge on the operation of ballistic T-branch junctions: a self-consistent model for Monte Carlo simulations
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Influence of the surface charge on the operation of ballistic T-branch junctions: a self-consistent model for Monte Carlo simulations

机译:表面电荷对弹道T型分支结的操作的影响:蒙特卡罗模拟的自洽模型

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摘要

We analyse the influence of the surface charge on the operation of ballistic T-branch junctions by means of a semi-classical 2D Monte Carlo simulator. We propose a new self-consistent model in which the local value of the surface charge is dynamically adjusted depending on the surrounding carrier density. The well-known parabolic behaviour of the central branch potential V_C when biasing right and left branches in a push-pull fashion is found to be much influenced by the value of the surface charge in both the horizontal and vertical branches. With the help of experimental measurements performed in real devices, the influence of the width of the central branch on the values of V_C and its relation to surface charge effects are also studied.
机译:我们通过半经典的2D蒙特卡洛仿真器分析了表面电荷对弹道T型分支结的操作的影响。我们提出了一种新的自洽模型,其中根据周围的载流子密度动态调整表面电荷的局部值。发现当以推挽方式偏置左右分支时,中心分支电势V_C的众所周知的抛物线行为受水平分支和垂直分支中的表面电荷值的很大影响。借助在真实设备中进行的实验测量,还研究了中心分支宽度对V_C值的影响及其与表面电荷效应的关系。

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