首页> 外文期刊>Semiconductor science and technology >Role of deposition and annealing of the top gate dielectric in a-IGZO TFT-based dual-gate ion-sensitive field-effect transistors
【24h】

Role of deposition and annealing of the top gate dielectric in a-IGZO TFT-based dual-gate ion-sensitive field-effect transistors

机译:顶栅电介质的沉积和退火在基于IGZO TFT的双栅离子敏感场效应晶体管中的作用

获取原文
获取原文并翻译 | 示例
           

摘要

The deposition of the top gate dielectric in thin film transistor (TFT)-based dual-gate ionsensitive field-effect transistors (DG ISFETs) is critical, and expected not to affect the bottom gate TFT characteristics, while providing a higher pH sensitive surface and efficient capacitive coupling between the gates. Amorphous Ta2O5, in addition to having good sensing properties, possesses a high dielectric constant of similar to 25 making it well suited as the top gate dielectric in a DG ISFET by providing higher capacitive coupling (ratio of C-top/C-bottom) leading to higher amplification. To avoid damage of the a-IGZO channel reported to be caused by plasma exposure, deposition of Ta2O5 by e-beam evaporation followed by annealing was investigated in this work to obtain sensitivity over the Nernst limit. The deteriorated bottom gate TFT characteristics, indicated by an. increase in the channel conductance, confirmed that. plasma exposure is not the sole contributor to the changes. Oxygen vacancies at the Ta2O5/a-IGZO interface, which emerged during processing, increased the channel conductivity, became. filled by optimum annealing in oxygen at 400 degrees C for 1 h, which was confirmed by an. x-ray photoelectron spectroscopy. depth profiling analysis. The obtained pH sensitivity of the TFTbased DG ISFET was 402 mV pH(-1), which is about 6.8 times the Nernst limit (59 mV pH(-1)). The concept of capacitive coupling was also demonstrated by simulating an a-IGZO-based DG TFT structure. Here, the exposure of the top gate dielectric to. the electrolyte without applying any top gate bias led to changes in the measured threshold voltage of the bottom gate TFT, and this obviated the requirement of a reference electrode needed in conventional ISFETs and other reported DG ISFETs. These devices, with high sensitivities and requiring low volumes (similar to 2 mu l) of analytesolution, could be potential candidates for utilization as chemical sensors and biosensors.
机译:在基于薄膜晶体管(TFT)的双栅离子敏感场效应晶体管(DG ISFET)中,顶栅电介质的沉积至关重要,并且在提供更高的pH敏感表面和抗氧化性能的同时,预计不会影响底栅TFT的特性。栅极之间的有效电容耦合。非晶态的Ta2O5除了具有良好的感测特性外,还具有接近25的高介电常数,通过提供更高的电容耦合(C顶/ C底比),非常适合用作DG ISFET中的顶栅电介质。更高的放大倍数。为避免报道的由等离子体暴露引起的a-IGZO通道损坏,在这项工作中研究了通过电子束蒸发沉积Ta2O5,然后进行退火以获得超过能斯特极限的灵敏度。底栅TFT特性劣化,由a表示。通道电导的增加,证实了这一点。血浆暴露不是导致变化的唯一因素。在加工过程中出现的Ta2O5 / a-IGZO界面处的氧空位增加了沟道电导率。通过在400摄氏度的氧气中进行1小时的最佳退火来填充,这由X射线光电子能谱。深度剖析分析。基于TFT的DG ISFET获得的pH灵敏度为402 mV pH(-1),约为能斯特极限(59 mV pH(-1))的6.8倍。电容耦合的概念还通过模拟基于a-IGZO的DG TFT结构得到了证明。在这里,顶栅介质暴露于其中。电解液不施加任何顶栅偏压会导致底栅TFT的测量阈值电压发生变化,从而避免了常规ISFET和其他已报道的DG ISFET中对参考电极的要求。这些设备具有高灵敏度并需要小体积(约2微升)的分析物溶液,可能成为用作化学传感器和生物传感器的潜在候选者。

著录项

  • 来源
    《Semiconductor science and technology》 |2017年第3期|035013.1-035013.10|共10页
  • 作者单位

    Indian Inst Technol Kanpur, Mat Sci Programme, Kanpur 208016, Uttar Pradesh, India|Indian Inst Technol Kanpur, Samtel Ctr Display Technol, Kanpur 208016, Uttar Pradesh, India;

    Indian Inst Technol Kanpur, Mat Sci Programme, Kanpur 208016, Uttar Pradesh, India;

    Indian Inst Technol Kanpur, Mat Sci Programme, Kanpur 208016, Uttar Pradesh, India;

    Indian Inst Technol Kanpur, Mat Sci Programme, Kanpur 208016, Uttar Pradesh, India|Indian Inst Technol Kanpur, Samtel Ctr Display Technol, Kanpur 208016, Uttar Pradesh, India|Indian Inst Technol Kanpur, Dept Chem Engn, Kanpur 208016, Uttar Pradesh, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    dual-gate ISFETs; a-IGZO TFT; pH sensor; top gate dielectric; deposition and anneal;

    机译:双栅ISFET;a-IGZO TFT;pH传感器;顶栅电介质;沉积和退火;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号