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Not All RETs Are Created Equal

机译:并非所有RET都相等

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As linewidths continue to scale, the industry continually evaluates how best to get the sizes and performance need-ed. Reducing the wavelength of light — whether through tricks like immersion lithography or through source changes like EUV lithography — is one way to get there, but chipmakers will first try to get everything they can out of their existing photol ithography tools. Freescale Semiconductor (Austin, Texas) and Photronics Inc. (Brookfield, Conn.) announced recently some results from their ongoing joint research into resolution enhancement techniques (RETs), which let users get more out of conventional tools than they would with standard binary masks. The chip-maker and maskmaker have been working together for close to two years, with a formal agreement in place since December 2004, to jointly explore the various approaches for preparing leading-edge reticles for 65 nm and below semiconductor manufacturing.
机译:随着线宽的不断扩大,行业不断评估如何最好地获得所需的尺寸和性能。减少光的波长-无论是通过浸没式光刻之类的技巧还是通过诸如EUV光刻之类的光源更改-都是达到这一目标的一种方法,但是芯片制造商将首先尝试从现有的光刻技术中获取所有可能的东西。飞思卡尔半导体公司(德克萨斯州奥斯汀)和光电子公司(康涅狄格州布鲁克菲尔德)最近宣布了他们正在进行的分辨率增强技术(RET)联合研究的一些结果,与标准二进制掩模相比,该技术可使用户从传统工具中获得更多收益。芯片制造商和掩模制造商已经合作了近两年,从2004年12月开始正式协议,共同探索各种方法来制备用于65 nm及以下半导体制造的尖端分划板。

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