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Coo Dictates Memory's Move To Copper

机译:Coo指示记忆向铜迁移

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Ten years after its initial introduction for logic device manufacturing, copper interconnect technology is rapidly being adopted for memory chip production. For advanced nodes, the technical advantages of a copper metallization scheme over an aluminum interconnect have long been recognized. In comparison to aluminum interconnects, the reduced RC delay of copper means increased device speeds, lower power consumption, and lower operating temperatures -features that are important for all semiconductor applications. For memory chipmakers in particular, copper allows longer wiring runs than aluminum, while supporting new DRAM architectures such as DDR3 and DDR4. The primary driver for the migration of copper metallization into memory devices is not a technical one - it's all about cost. Recent macroeconomic issues have put unprecedented pressures on the average selling price of memory chips, requiring chipmakers to significantly accelerate cost reduction to maintain profitability. Without question, the most effective way to reduce manufacturing cost is to leverage Moore's Law and take advantage of die shrinks associated with technology node advancements. A decade ago, in seeking to build smaller and more powerful chips, the logic manufacturers had to shift to copper interconnect for functional performance and device speed.
机译:最初将其引入逻辑器件制造十年后,铜互连技术已迅速用于存储芯片生产。对于高级节点,人们早已认识到铜金属化方案优于铝互连的技术优势。与铝互连相比,铜的RC延迟减少意味着器件速度提高,功耗降低,工作温度降低,这些功能对于所有半导体应用都是重要的。特别是对于内存芯片制造商,铜线比铝线允许更长的布线时间,同时支持DDR3和DDR4等新型DRAM架构。铜金属化迁移到存储设备的主要驱动因素不是技术因素,而是成本。最近的宏观经济问题给存储芯片的平均售价带来了前所未有的压力,要求芯片制造商大幅加快成本削减以保持盈利能力。毫无疑问,降低制造成本的最有效方法是利用摩尔定律,并利用与技术节点发展相关的芯片收缩。十年前,为了寻求制造更小,功能更强大的芯片,逻辑制造商不得不转向铜互连以提高功能性能和设备速度。

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