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Lattice parameter and density of Ge-Si solid solutions

机译:锗硅固溶体的晶格参数和密度

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Solid solutions of the Ge-Si system have been prepared by reaction under vacuum and gravity of the constituent elements followed by different quenching procedures. Least-squares refinement to the lattice parameters of the Ge-Si phase has been established in the composition range 0.5-0.9 at /100 Si. Almost homogeneous alloys were obtained by rapid quenching in liquid nitrogen, whereas pseudo-homogeneous alloys occur as an intermediate stage when quenched in water. The refined lattice parameters, although computed with very high precision, did not predict The formation rate of the solid solution.
机译:通过在组成元素的真空和重力下反应,然后进行不同的淬火程序,制备了锗硅系统的固溶体。锗硅相的晶格参数的最小二乘法已经在/ 100 Si的0.5-0.9范围内建立。通过在液氮中快速淬火可获得几乎均质的合金,而假均质合金在水中淬火时作为中间阶段出现。精确的晶格参数尽管以非常高的精度计算,但不能预测固溶体的形成速率。

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