The Thick-800 XRF Analyzer from Skyray XRF features a top-down measurement system. This style allows for a sample stage with 3-D movement. This system also allows Skyray XRF to offer a three-sided chamber door so users can measure smaller samples with the door closed or open the door to create a slotted chamber and fit larger samples or printed circuit boards.rnThe Thick-800 was developed with a color camera sample viewing system and double laser position technology. It can provide measurements of single layer, multiple layers, thin film coatings and solders with composition.
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