CONSTRUCTION OF DOUBLE SAMPLING s-CONTROL CHARTS FOR AGILE MANUFACTURING

摘要

Double sampling (DS) X-bar-control charts are designed to allow quick detection of a small shift of process mean and provides a quick response in an agile manufacturing environment. However, the DS X-bar-control charts assume that the process standard deviation remains unchanged throughout the entire course of the statistical process control. Therefore, a complementary DS chart that can be used to monitor the process variation caused by changes in process standard deviation should be developed. In this paper, the development of the DS s-charts for quickly detecting small shift in process standard deviation for agile manufacturing is presented.