首页> 外文期刊>Proceedings of the institution of mechanical engineers >Silicon nitride nanostructures prepared by reactive sputtering using closed-field unbalanced dual magnetrons
【24h】

Silicon nitride nanostructures prepared by reactive sputtering using closed-field unbalanced dual magnetrons

机译:使用闭场不平衡双磁控管通过反应溅射制备的氮化硅纳米结构

获取原文
获取原文并翻译 | 示例
           

摘要

In this work, silicon nitride nanostructures were prepared by a reactive sputtering technique employing, a novel design of closed-field unbalanced dual magnetron system. The optical properties of the prepared nanostructures were studied by their absorption and transmission spectra in the range of 200-800nm. As well, the structural properties of these structures were studied to determine the optimum geometry of the employed closed-field unbalanced dual magnetron configuration. The produced Si3N4 nanostructures showed high absorption in the ultraviolet wavelength region (<200nm) in addition to an absorption band centered at 389nm. The energy gap of the prepared samples was found to be 5.2 eV of allowed and direct type. Structural results showed that the prepared samples were amorphous with average particle size of 20-30nm, average particle diameter of 99.22nm and average roughness of 0.777nm. In this technique, low cost, high purity and homogeneous surfaces can be prepared by the effective control of the operation parameters, especially the geometry of closed-field unbalanced dual magnetron configuration.
机译:在这项工作中,采用反应场溅射技术,采用一种新颖的闭场不平衡双磁控管系统设计,制备了氮化硅纳米结构。通过其在200-800nm范围内的吸收和透射光谱研究了所制备的纳米结构的光学性质。同样,研究了这些结构的结构特性,以确定所采用的封闭场不平衡双磁控管配置的最佳几何形状。产生的Si3N4纳米结构除了在389nm处有吸收带外,还在紫外波长区域(<200nm)中显示出高吸收。发现所制备样品的能隙为允许和直接类型的5.2 eV。结构结果表明,所制备的样品为非晶态,平均粒径为20-30nm,平均粒径为99.22nm,平均粗糙度为0.777nm。在这种技术中,可以通过有效控制运行参数,特别是封闭场不平衡双磁控管结构的几何形状,来制备低成本,高纯度和均质的表面。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号