Trace element analysis using a benchtop total reflection X-ray fluorescence spectrometer

摘要

Total reflection X-ray fluorescence analysis (TXRF) is an established technique for trace element analysis in various sample types. Restricted in the past to expensive large-scale systems, in this study the capability of a benchtop system for trace element analysis is reported. By analysing various heavy metals in raw and digested sewage as well as mercury in recycling glass, the suitability of the TXRF system for these kinds of applications could be proven. Based on this data, the benefits, disadvantages, and restrictions of the benchtop system in comparison to other trace element techniques like inductively coupled plasma optical emission spectroscopy (ICP-OES) and atomic adsorption spectroscopy (AAS) are evaluated.