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Deconvolution-convolution treatment on powder diffraction data collected with CuKa X-ray and NiKβ filter

机译:用CuKa X射线和NiKβ滤光片对粉末衍射数据进行去卷积处理

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摘要

A method to remove small CuK beta peaks and step structures caused by NiK-edge absorption as well as CaK alpha(2) sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution-convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuK alpha X-ray source, Ni-foil K beta filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuK beta peaks and NiK-edge step structures. (C) 2018 International Centre for Diffraction Data.
机译:提出了一种从用Cu靶X射线源和Ni箔滤光片测量的粉末衍射强度数据中去除由NiK边缘吸收以及CaK alpha(2)亚峰引起的小的CuK beta峰和台阶结构的方法。该方法基于反卷积-卷积处理,其中应用了横坐标的比例变换,傅里叶变换和源X射线的真实光谱模型。通过分析标准LaB6粉末(NIST SRM660a)样品的粉末衍射数据,测试了该方法的有效性,该样品由CuKαX射线源,Ni箔K beta滤光片,扁平粉末样品和一个硅条检测器。用该方法处理的衍射强度数据无疑显示了背景强度曲线,没有CuKβ峰和NiK边缘台阶结构。 (C)2018年国际衍射数据中心。

著录项

  • 来源
    《Powder diffraction》 |2018年第2期|80-87|共8页
  • 作者单位

    Nagoya Inst Technol, Adv Ceram Res Ctr, Tajimi, Gifu 5070071, Japan;

    Nagoya Inst Technol, Adv Ceram Res Ctr, Tajimi, Gifu 5070071, Japan;

    Nagoya Inst Technol, Adv Ceram Res Ctr, Tajimi, Gifu 5070071, Japan;

    Nagoya Inst Technol, Adv Ceram Res Ctr, Tajimi, Gifu 5070071, Japan;

    Nagoya Inst Technol, Adv Ceram Res Ctr, Tajimi, Gifu 5070071, Japan;

    Natl Inst Adv Ind Sci & Technol, Inorgan Funct Mat Res Inst, Moriyama Ku, Nagoya, Aichi 4638560, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CuK-emission; NiK beta filter; bremsstrahlung; deconvolution; convolution;

    机译:CuK发射;NiK beta滤波器;bre致辐射;去卷积;卷积;

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