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Hole-polar phonon interaction scattering mobility in chain structured TISe_(0.75)S_(0.25) crystals

机译:链结构TISe_(0.75)S_(0.25)晶体中的空穴-极性声子相互作用散射迁移率

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In this study, the electrical resistivity, charge carriers density and Hall mobility of chain structured TlSe_(0.75)S_(0.25) crystal have been measured and analyzed to establish the dominant scattering mechanism in crystal. The data analyses have shown that this crystal exhibits an extrinsic p-type conduction. The temperature-dependent dark electrical resistivity analysis reflected the existence of three energy levels located at 280 meV, 68 meV and 48 meV. The temperature dependence of carrier density was analyzed by using the single donor-single acceptor model. The carrier concentration data were best reproduced assuming the existence of an acceptor impurity level being located at 68 meV consistent with that observed from resistivity measurement. The model allowed the determination of the hole effective mass and the acceptor-donor concentration difference as 0.44m_0 and 2.2×10~(12)cm~3, respectively. The Hall mobility of the TlSe_(0.75)S_(0.25) crystal is found to be limited by the scattering of charged carriers over the (chain) boundaries and the scattering of hole-polar phonon interactions above and below 300 K, respectively. The value of the energy barrier height at the chain boundaries was found to be 261 meV. The polar phonon scattering mobility revealed the high-frequency and static dielectric constants of 13.6 and 15.0, respectively.
机译:在这项研究中,对链结构的TlSe_(0.75)S_(0.25)晶体的电阻率,电荷载流子密度和霍尔迁移率进行了测量和分析,以建立晶体中的主要散射机制。数据分析表明,该晶体表现出外在的p型传导。与温度有关的暗电阻率分析反映出存在三个能级,分别为280 meV,68 meV和48 meV。通过使用单个供体-单受体模型分析了载流子密度的温度依赖性。假设受主杂质水平位于与电阻率测量所观察到的一致的68 meV处,则可以最好地重现载流子浓度数据。该模型允许确定空穴有效质量和受体-供体浓度差分别为0.44m_0和2.2×10〜(12)cm〜3。发现TlSe_(0.75)S_(0.25)晶体的霍尔迁移率分别受(链)边界上带电载流子的散射以及高于和低于300 K的空穴-极性声子相互作用的散射的限制。发现在链边界的能垒高度的值为261meV。极性声子散射迁移率分别显示出13.6和15.0的高频和静态介电常数。

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