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Optical phase diagram of amorphous carbon films determined by spectroscopic ellipsometry

机译:椭圆偏振光谱法测定非晶碳膜的光学相图

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摘要

In this study we show how amorphous carbon films can be categorized using their optical properties which change according to their structure and composition. Hydrogenated and hydrogen free diamond- and graphite-like carbon films, characterized previously by several methods, were analyzed with spectroscopic ellipsometry in the 1.24-5 eV photon energy range. To model the measured Ψ and △ spectra the optical properties of the films were described with Tauc-Lorentz oscillator model, Gaussian line shape and Cauchy's dispersion relation. The results and the films are compared in terms of the highest refractive index (n_(max)) and the corresponding pho-rnton energy (E_(max)). When plotting E_(max) as a function of the maximal refractive index the data draw out a curved track. The data of different type films are located at different parts of the curve which are placed at corresponding positions for all models. Thus the trends derived with different modeling are the same, even though the optical properties of the films derived from ellipsometric measurements may slightly depend on the applied model. Hence this representation of the refractive index of a-C and a-C:H films can be utilized for qualitative analysis.
机译:在这项研究中,我们展示了如何使用随其结构和组成而变化的光学性质对无定形碳膜进行分类。用光谱椭圆偏光法在1.24-5 eV光子能量范围内分析了氢化和无氢的类金刚石和石墨碳膜,以前用几种方法进行了表征。为了模拟测得的Ψ和△光谱,用Tauc-Lorentz振荡器模型,高斯线形和柯西色散关系描述了薄膜的光学特性。将结果和薄膜根据最高折射率(n_(max))和相应的光子能量(E_(max))进行比较。当根据最大折射率绘制E_(max)时,数据绘制出一条弯曲的轨迹。对于所有型号,不同类型胶片的数据位于曲线的不同部分,这些部分放置在相应位置。因此,即使从椭偏测量得到的薄膜的光学特性可能在某种程度上取决于所应用的模型,但通过不同模型得出的趋势是相同的。因此,这种a-C和a-C:H薄膜折射率的表示可以用于定性分析。

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