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Mercury-cadmium-telluride thin layers as subterahertz and infrared detectors

机译:碲镉汞薄层作为太赫兹和红外探测器

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摘要

Issues associated with the development and exploitation of infrared (IR) and terahertz (THz) radiation detectors based on a narrow-gap "HgCdTe" semiconductor have been discussed. This mercury-cadmium-tel-luride (MCT) semiconductor can be applied for two-color detector operation in IR and sub-THz spectral ranges. Two-color uncooled and cooled down to 78 K narrow-gap MCT semiconductor thin layers grown using the liquid phase epitaxy or molecular beam epitaxy methods on high-resistive "CdZnTe" or "GaAs" substrates, with bow-type antennas, have been considered both as sub-THz direct detection bolometers and 3 to 10 µm IR photo-conductors. Their room temperature noise equivalent power at the frequency v ≈ 140 GHz and signai-to-noise ratio at the spectral sensitivity maximum under monochromatic (spectral resolution ~0.I μm) globar illumination reached the following values; ~4.5 x 10~(-10) W/Hz~(1/2) and ~50, respectively. Aspheric lenses used for obtaining the images in the sub-THz spectral region were designed and manufactured. With these detectors, about 140 and 270 GHz imaging data have been demonstrated.
机译:讨论了与基于窄间隙“ HgCdTe”半导体的红外(IR)和太赫兹(THz)辐射探测器的开发和利用有关的问题。这种汞-镉-telluride(MCT)半导体可用于红外和亚太赫兹光谱范围内的双色探测器操作。已经考虑了采用液相外延或分子束外延方法在带有弓形天线的高电阻“ CdZnTe”或“ GaAs”衬底上生长的两色未冷却并冷却至78 K窄间隙MCT半导体薄层的方法既可作为亚太赫兹直接检测测辐射热计,又可作为3至10 µm红外光电导体。在单色(光谱分辨率〜0.1μm)球状光源照射下,它们在频率v≈140 GHz时的室温噪声等效功率和在光谱灵敏度最大时的信噪比达到以下值;分别为〜4.5 x 10〜(-10)W / Hz〜(1/2)和〜50。设计并制造了用于获得亚太赫兹光谱范围内图像的非球面透镜。使用这些检测器,已经证明了约140和270 GHz的成像数据。

著录项

  • 来源
    《Optical engineering》 |2015年第12期|337-337|共1页
  • 作者单位

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    A.V. Rzhanov Institute of Semiconductor Physics, pr. Lavrentieva 13, Novosibirsk 630090, Russia;

    A.V. Rzhanov Institute of Semiconductor Physics, pr. Lavrentieva 13, Novosibirsk 630090, Russia;

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    V.E. Lashkaryov Institute of Semiconductor Physics, 41 pr. Nauky, Kyiv, 03028, Ukraine;

    Universidad Autonoma de Madrid, Cantoblanco, Madrid 28049, Spain;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    mercury-cadmium-telluride; two-color detector; infrared; sub-terahertz; lenses;

    机译:碲化汞镉;双色检测器;红外线;太赫兹镜片;

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