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Defected ground structure (DGS)-integrated rectangular microstrip patch for improved polarisation purity with wide impedance bandwidth

机译:集成了接地结构(DGS)的矩形微带贴片,可提高极化纯度,并具有宽阻抗带宽

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摘要

Defected ground structure (DGS)-integrated rectangular microstrip patch has been experimentally investigated with an aim to improve polarisation purity in radiated fields. Width to length ratio (aspect ratio) of a patch attributes different characteristic features. Therefore present experimental studies have been executed for four different aspect ratio values like 1.6, 1.3, 1.0 and 0.8. Folded defects have been employed in H-plane. Possibility of achieving high polarisation purity (over 25 dB isolation between co- to cross-polarised fields) with improved impedance bandwidth has been demonstrated. The variation in XP fields as a function of the patch aspect ratio has been investigated and a strong physical insight into the modal fields with and without DGS has been developed.
机译:缺陷地面结构(DGS)集成的矩形微带贴片已进行了实验研究,目的是提高辐射场中的极化纯度。贴片的宽长比(长宽比)具有不同的特征。因此,目前已经针对四个不同的长宽比值(例如1.6、1.3、1.0和0.8)执行了实验研究。折叠缺陷已用于H平面。已经证明可以实现高极化纯度(共极化和交叉极化场之间的隔离度超过25 dB)并具有改进的阻抗带宽。已经研究了XP场随面片纵横比的变化,并且已经开发了对具有和不具有DGS的模态场的强大物理见解。

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  • 来源
    《Microwaves, Antennas & Propagation, IET》 |2014年第8期|589-596|共8页
  • 作者

    Kumar C.; Guha D.;

  • 作者单位

    Department of Space, Government of India, Communication Systems Group, ISRO Satellite Centre, HAL Airport Road, Bangalore 560017, India|c|;

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  • 正文语种 eng
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