Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition

摘要

This paper presents a new timing analysis methodology for clock driven scan design integrated circuits, based on externally triggered pulsed laser stimulation. The laser pulse can easily be shifted to time windows of interest in reference to clock and scan pattern. It is demonstrated that the technique is able to identify the most sensitive signal condition for fault injection with a time resolution correlated to the signal switching time, offering new opportunities to failure analysis.