首页> 外文期刊>Microelectronics & Reliability >Atmospheric corrosion resistance of electroplated Ni/Ni-P/Au electronic contacts
【24h】

Atmospheric corrosion resistance of electroplated Ni/Ni-P/Au electronic contacts

机译:电镀Ni / Ni-P / Au电子触点的耐大气腐蚀性能

获取原文
获取原文并翻译 | 示例
           

摘要

Atmospheric corrosion has vast consequences on the reliability of electronic connectors. This study determined the corrosion resistance of Ni/Ni-P plating metallurgy as a function of plating current density and plating thickness. Discrepancy was observed in the neutral salt spray (NSS) and mixed flowing gas (MFG) tests. Thicker Ni-P deposits displayed superior corrosion resistance in MFG tests while thinner Ni-P deposits performed better in NSS tests. This disparity was attributed to the intrinsic corrosion susceptibility of Ni-P against chlorine or sulfur assisted corrosion. Corrosion products were analysed for better understanding of the corrosion mechanism. NSS test produced green corrosion residues consisting of CuCl (nantokite) and CuCl2(OH)(3) (clinoatacamite) and brown residues consisting of Cu2O (cuprite). MFG test produced sulfides of copper (major) and nickel (minor). (C) 2016 Elsevier Ltd. All rights reserved.
机译:大气腐蚀会对电子连接器的可靠性产生重大影响。这项研究确定了Ni / Ni-P电镀冶金的耐腐蚀性与电镀电流密度和电镀厚度的关系。在中性盐雾(NSS)和混合流动气体(MFG)测试中观察到差异。较厚的Ni-P沉积物在MFG测试中显示出优异的耐腐蚀性,而较薄的Ni-P沉积物在NSS测试中表现更好。这种差异归因于Ni-P对氯或硫辅助腐蚀的固有腐蚀敏感性。分析腐蚀产物以更好地了解腐蚀机理。 NSS测试产生的绿色腐蚀残留物包括CuCl(钙铝石)和CuCl2(OH)(3)(斜铁沸石),以及棕色残留物由Cu2O(亚铜铁矿)组成。 MFG测试产生了铜(主要)和镍(次要)的硫化物。 (C)2016 Elsevier Ltd.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号