Phase-change memory devices with stacked Ge-chalcogenide/Sn-chalcogenide layers

摘要

Non-volatile memory devices with two stacked layers of chalcogenide materials comprising the active memory device have been investigated for their potential as phase-change memories. The devices tested consisted of GeTe/SnTe, Ge_2Se_3/SnTe, and Ge_2Se_3/SnSe stacks. All devices exhibited resistance switching behavior. The polarity of the applied voltage with respect to the SnTe or SnSe layer was critical to the memory switching properties, most likely due to the voltage induced movement of either Sn or Te into the Ge-chalcogenide layer.