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A Simple Technique to Readout and Characterize Coupled MEMS Resonators

机译:读出和表征耦合MEMS谐振器的简单技术

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Highly sensitive microelectromechanical system (MEMS) resonators have been used for extensive applications such as mass sensing. However, these arrays are prone to process variations and are difficult to characterize due to lack of connections with each resonator. Coupled array of such sensors can enhance functionality while reducing interconnections. This scheme allows a number of sensors to be read out using a single input/output channel. By perturbing the spring constant of one resonator, two sets of eigenvalues can be measured to reconstruct the system matrix of the coupled system. However, perturbation on MEMS devices can introduce non-linear or physical change. To prevent such undesired change, this paper proposes a technique to couple an electrical resonator to an array of MEMS resonators. Two sets of eigenvalues can therefore be measured by simply connecting/disconnecting the electrical resonator. Errors introduced by frequency noise, array size, coupling strength, and damping have been analyzed. The successful coupling between electrical and mechanical resonators brings huge promise for integrated MEMS devices that could be used for single input/output multi-sensor and monitoring variations in MEMS fabrication. [2015-0299]
机译:高灵敏度的微机电系统(MEMS)谐振器已用于诸如质量传感之类的广泛应用。但是,由于缺少与每个谐振器的连接,这些阵列易于产生工艺变化并且难以表征。这种传感器的耦合阵列可以增强功能,同时减少互连。该方案允许使用单个输入/输出通道读取多个传感器。通过扰动一个谐振器的弹簧常数,可以测量两组特征值,以重建耦合系统的系统矩阵。然而,MEMS器件上的扰动会引入非线性或物理变化。为了防止这种不希望的变化,本文提出了一种将电谐振器耦合到MEMS谐振器阵列的技术。因此可以通过简单地连接/断开电谐振器来测量两组特征值。分析了由频率噪声,阵列尺寸,耦合强度和阻尼引起的误差。电气和机械谐振器之间的成功耦合为集成MEMS器件带来了广阔前景,该器件可用于单个输入/输出多传感器并监视MEMS制造中的变化。 [2015-0299]

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