Software start-up plugs wireless tracking system to end consumables 'chaos'

摘要

At the micro-let alone the nano-level, the semiconductor world relies on increasingly strict parameters to deal with the many process control issues that arise in the fab. Process engineers would wince at the thought of leaving critical dimension control, the prevention of copper migration, 300-mm challenges, or next-generation lithography solutions to chance. But at the macro level-the world of supplies, consumables, and spare parts-chaos often reigns.