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首页> 外文期刊>Measurement techniques >PRINCIPLES OF CONSTRUCTING FAILURE-RESISTANT MEASUREMENT TECHNOLOGY MICROPROCESSOR DEVICES WITH a posteriori CORRECTION OF Multiple errors (DISCUSSION)
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PRINCIPLES OF CONSTRUCTING FAILURE-RESISTANT MEASUREMENT TECHNOLOGY MICROPROCESSOR DEVICES WITH a posteriori CORRECTION OF Multiple errors (DISCUSSION)

机译:具有多个错误的后验校正的构造抗故障测量技术微处理器设备的原理(讨论)

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摘要

A method is considered for ensuring failure-resistant operation of computer memory devices which is based on linear correcting codes with a posteriori correction of multiple errors of multiple errors. The proposed method makes it possible to extend the correcting possibilities of the code, i.e., to determine the configuration of any error with minimum code requirements, requirements of hardware and time.
机译:考虑一种用于确保计算机存储设备的抗故障操作的方法,该方法基于具有多个错误的多个错误的后验校正的线性校正码。所提出的方法使得有可能扩展代码的校正可能性,即,以最小的代码需求,硬件需求和时间来确定任何错误的配置。

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