MEASUREMENT OF THE TEMPERATURE FIELD DISTRIBUTION OF MATERIALS IN MICROWAVE-DEVICES BASED ON SLOW-WAVE SYSTEMS

I. V. Nazarov

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MEASUREMENT OF THE TEMPERATURE FIELD DISTRIBUTION OF MATERIALS IN MICROWAVE-DEVICES BASED ON SLOW-WAVE SYSTEMS

机译：基于慢波系统的微波装置中材料温度场分布的测量

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摘要

The results of a calculation and measurements of the temperature field of sheet dielectric materials, obtained when they are heat treated in microwave devices, using different slow-wave structures as the heating elements, are presented.

机译：介绍了使用不同的慢波结构作为加热元件在微波设备中热处理时获得的片状介电材料的温度场的计算和测量结果。

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来源
《Measurement techniques》 |2008年第3期|p.285-289|共5页
作者
I. V. Nazarov;
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作者单位

Moscow State Institute of Electronics and Mathematics (Technical University);

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类计量学;
关键词
slow-wave structure; traveling-wave field; temperature-field distribution; dielectrics;

机译：慢波结构;行波场;温度场分布;电介质;

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MEASUREMENT OF THE TEMPERATURE FIELD DISTRIBUTION OF MATERIALS IN MICROWAVE-DEVICES BASED ON SLOW-WAVE SYSTEMS

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