GENERALIZED INTERVAL METHOD OF BISECTION FOR METROLOGICALLY BASED SEARCH FOR SOLUTIONS OF SYSTEMS OF EQUATIONS WITH INACCURATELY SPECIFIED INITIAL DATA

摘要

A method of solving systems of nonlinear equations for use in metrological applications based on the generalized method of bisection is presented. It is shown that through the use of the proposed approach it is possible to satisfy requirements imposed on the solution as regards the set of results of indirect measurements and to take into account data on the inaccuracy of the coefficients of the equations to be solved, which are the results of direct measurements. The resulting solution is automatically tracked by a reliable estimate of the limiting error of its components.