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首页> 外文期刊>Materials Research Bulletin >Synthesis, microstructure, and electronic band structure properties of nanocrystalline neodymium-doped bismuth titanate ferroelectric films fabricated by the sol-gel method
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Synthesis, microstructure, and electronic band structure properties of nanocrystalline neodymium-doped bismuth titanate ferroelectric films fabricated by the sol-gel method

机译:溶胶-凝胶法制备纳米晶掺钕钛酸铋铁电薄膜的合成,微结构和电子能带结构性质

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摘要

Bi_(4-x)Nd_xTi_3O_(12) (BNT) films with different Nd contents (from 0 to 1 with 0.25 intervals) are prepared by the sol-gel process. The Nd substitution effects on the preferred orientation, surface morphology, phonon modes, emission bands, andelectronic band structures of the BNT films are investigated by microscopy, Raman scattering, photoluminescence, and spectroscopic ellipsometry (SE) at room temperature. X-ray diffraction indicates that the films are polycrystalline with the pure perovskite phase. Ten Raman active modes and one silicon substrate mode can be observed. The A_1 _g[Bi] at about 59cm~(-1) is unchanged whereas the B_1 g and A_1 g[Ti] phonon modes shift towards higher frequencies. Photoluminescence shows that the intensities of the two peaks increase with Nd concentration except the Bi_3NdTi_3O_(12) film, due to the smallest grain size and oxygen vacancy defects. Good optical functions of the BNT films are achieved due to the SE suggesting potential applications in ferroelectric-based optoelectronic devices.
机译:通过溶胶-凝胶法制备了Nd含量不同(从0到1,间隔为0.25)的Bi_(4-x)Nd_xTi_3O_(12)(BNT)膜。在室温下,通过显微镜,拉曼散射,光致发光和椭圆偏振光谱法(SE)研究了Nd取代对BNT薄膜的优选取向,表面形态,声子模式,发射带和电子能带结构的影响。 X射线衍射表明该膜是具有纯钙钛矿相的多晶。可以观察到十种拉曼有源模式和一种硅衬底模式。在大约59cm〜(-1)处的A_1 _g [Bi]不变,而B_1 g和A_1 g [Ti]声子模向更高的频率移动。光致发光表明,除了Bi_3NdTi_3O_(12)膜以外,这两个峰的强度均随Nd浓度的增加而增加,这是由于晶粒尺寸最小和氧空位缺陷所致。由于SE表明BNT膜具有良好的光学功能,因此有望在基于铁电体的光电器件中应用。

著录项

  • 来源
    《Materials Research Bulletin》 |2015年第1期|238-244|共7页
  • 作者单位

    College of Communications and Electronics Engineering, Qiqihar University, Heilongjiang 161006, China,National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China,Computer Center, Qiqihar University, Heilongjiang 161006, China;

    Department of Physics and Material Sciences, City University of Hong Kong, Tat Chee Avenue, Kowloon, Hong Kong, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A. Thin films; B. Sol-gel chemistry; C. Raman spectroscopy; D. Electrical properties;

    机译:A.薄膜;B.溶胶-凝胶化学;C.拉曼光谱;D.电性能;

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