Measurement of Thermally Stimulated Currents and Estimation of Trapping Parameters in Amorphous Se_(90)Sb_8Ag_2 Thin Films

摘要

Thermally stimulated currents (TSC) have been measured at different heating rates in a-Se_(90)Sb_8Ag_2 thin films prepared by vacuum evaporation. A TSC peak occurs at a particular temperature that shifts towards higher temperature as heating rates is increased. Trap depth and trap concentration are also evaluated by various methods. The average value of trap depth (E_t) is 0.30 eV and calculated value of trap density (N_t) is 2.21 × 10~(18) cm~(-3).